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Join William Meeker, PhD, Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University, and Leo Wright, Principal Customer Advocate of SAS, to learn more about the next generation of reliability data.
This new complimentary four-part series will deliver key insights about probability plots and life distribution, multiple failure modes, modeling life with explanatory variables and accelerated life testing. You’ll walk away with a better understanding of how to:
- Avoid the pitfalls of using three-parameter distributions.
- Estimate life distribution characteristics.
- Analyze separate failure modes and identify failure causes.
- Streamline product development through accelerated life testing.
Read more about William Meeker.
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Exploring Reliability with William Meeker
On-Demand Webcast Series
About the Speaker
 William Q. Meeker is a Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University.
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